Raman spectroscopic and X-ray diffraction investigations of epitaxial BiCrO3 thin films

Thin Solid Films

Volumn 520, Issue 14, 2012, Pages 4590-4594

  Talkenberger, Andreas ^a   Himcinschi, Cameliu ^a   Weißbach, Torsten ^a   Vijayanandhini, Kannan ^b   Vrejoiu, Ionela ^b   Röder, Christian ^a   Rafaja, David ^a   Kortus, Jens ^a  

^a TU BERGAKADEMIE FREIBERG   (Germany)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

BiCrO3; Multiferroic thin films; Raman spectroscopy; XRD

Indexed keywords

BICRO3; CRYSTALLOGRAPHIC ORIENTATIONS; EPITAXIAL RELATIONS; HIGH RESOLUTION X RAY DIFFRACTION; MULTIFERROIC THIN FILMS; POLE FIGURE MEASUREMENTS; RAMAN SPECTROSCOPIC; SUBSTRATE SURFACE; THEORETICAL CALCULATIONS; X-RAY DIFFRACTION INVESTIGATIONS; XRD;

EPITAXIAL GROWTH; PULSED LASER DEPOSITION; RAMAN SPECTROSCOPY; X RAY DIFFRACTION;

EPITAXIAL FILMS;

EID: 84860286106     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.10.196     Document Type: Conference Paper

References (25)

1. Y.-H. Chu, L.W. Martin, M.B. Holcomb, M. Gajek, S.-J. Han, Q. He, N. Balke, C.-H. Yang, D. Lee, W. Hu, Q. Zhan, P.-L. Yang, A. Fraile- Rodríguez, A. Scholl, S.X. Wang, and R. Ramesh Nat. Mater. 7 2008 478
2. G. Catalan, and J.F. Scott Adv. Mater. 21 2009 2463
3. R. Ramesh, and N.A. Spaldin Nat. Mater. 6 2007 21
4. J. Wang, J.B. Neaton, H. Zheng, V. Nagarajan, S.B. Ogale, B. Liu, D. Viehland, V. Vaithyanathan, D.G. Schlom, U.V. Waghmare, N.A. Spaldin, K.M. Rabe, M. Wuttig, and R. Ramesh Science 299 2003 1719
5. H.W. Jang, D. Ortiz, S.-H. Baek, C.M. Folkman, R.R. Das, P. Shafer, Y. Chen, C.T. Nelson, X. Pan, R. Ramesh, and C.-B. Eom Adv. Mater. 21 2009 817
6. F. Sugawara, and S. Iida J. Phys. Soc. Jpn. 20 1965 1529
7. C. Darie, C. Goujon, M. Bacia, H. Klein, P. Toulemonde, P. Bordet, and E. Suard Solid State Sci. 12 2010 660
8. A.A. Belik, S. Iikubo, K. Kodama, N. Igawa, S. Shamoto, and E. Takayama-Muromachi Chem. Mater. 20 2008 11
9. A. David, P. Boullay, R.V.K. Mangalam, N. Barrier, and W. Prellier Appl. Phys. Lett. 96 2010 221904
10. M. Opel, S. Geprägs, E.P. Menzel, A. Nielsen, D. Reisinger, K.-W. Nielsen, A. Brandlmaier, F.D. Czeschka, M. Althammer, M. Weiler, S.T.B. Goennenwein, J. Simon, M. Svete, W. Yu, S.-M. Hühne, W. Mader, and R. Gross Phys. Status Solidi A 208 2011 2
11. N.A. Hill, P. Bättig, and C. Daul J. Phys. Chem. B 106 2002 13
12. D.H. Kim Appl. Phys. Lett. 89 2006 162904
13. D.A. Tenne, and X. Xi J. Am. Ceram. Soc. 91 2008 1820
14. J. Kreisel, and P. Bouvier J. Raman Spectrosc. 34 2003 524
15. R. Palai, R.S. Katiyar, H. Schmid, P. Tissot, S.J. Clark, J. Robertson, S.A.T. Redfern, G. Catalan, and J.F. Scott Phys. Rev. B 77 2008 0140110
16. C. Himcinschi, I. Vrejoiu, M. Friedrich, E. Nikulina, L. Ding, C. Cobet, N. Esser, M. Alexe, D. Rafaja, and D.R.T. Zahn J. Appl. Phys. 107 2010 123524
17. L.V. Azároff Elements of X-ray Crystallography 1968 McGraw-Hill Book Company New York, San Francisco, London 28
18. D. Rafaja, J. Kub, D. Šimek, J. Lindner, and J. Petzelt Thin Solid Films 422 2002 8
19. P. Kuppusami, G. Vollweiler, D. Rafaja, and K. Ellmer Appl. Phys. A 80 2005 183
20. PDF2 database on CD-ROM, ICDD Newtown Square, PA, USA, 2003.
21. C. Himcinschi, I. Vrejoiu, T. Weißbach, K. Vijayanandhini, A. Talkenberger, C. Röder, S. Bahmann, D.R.T. Zahn, A.A. Belik, D. Rafaja, and J. Kortus J. Appl. Phys. 110 2011 073501
22. D.L. Rousseau, R.P. Bauman, and S.P.S. Porto J. Raman Spectrosc. 10 1981 253
23. R. Loudon Adv. Phys. 50 2001 813
24. G. Turell J. Raman Spectrosc. 15 1984 103
25. V. Pajcini, and S.A. Asher J. Am. Chem. Soc. 121 1999 10942