Chemical and structural analysis of the bone-implant interface by TOF-SIMS, SEM, FIB and TEM: Experimental study in animal

Applied Surface Science

Volumn 258, Issue 17, 2012, Pages 6485-6494

  Palmquist, Anders ^a,b   Emanuelsson, Lena ^a,b   Sjövall, Peter ^b,c  

^a UNIVERSITY OF GOTHENBURG   (Sweden)

^b BIOMATCELL VINN Excellence Center of Biomaterials and Cell Therapy   (Sweden)

^c SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

Author keywords

Focused ion beam (FIB); Interface analysis; Osseointegration; Time of flight secondary ion mass spectroscopy (TOF SIMS); Transmission electron microscopy (TEM)

Indexed keywords

BONE; FOCUSED ION BEAMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; ION BEAMS; IONS; POLYMER BLENDS; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; STRUCTURAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

ANATOMICAL STRUCTURES; BONE-IMPLANT INTERFACES; CHEMICAL INFORMATION; INTERFACE ANALYSIS; OSSEOINTEGRATION; SAMPLE PREPARATION TECHNIQUES; STRUCTURAL INFORMATION; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROSCOPY;

CHEMICAL ANALYSIS;

EID: 84860261391     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.03.065     Document Type: Article

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