Direct determination of localized impurity levels located in the blocking layers of Bi 2Sr 2CaCu 2O y using scanning tunneling microscopy/spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 2, 2005, Pages

  Kinoda, G ^a   Mashima, H ^b   Shimizu, K ^c   Shimoyama, J ^c   Kishio, K ^c   Hasegawa, T ^a,c  

^a KANAGAWA ACADEMY OF SCIENCE AND TECHNOLOGY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH DERIVATIVE; CALCIUM DERIVATIVE; COPPER DERIVATIVE; METAL OXIDE; STRONTIUM;

ARTICLE; CONDUCTANCE; CRYSTAL; ENERGY; IMAGE ANALYSIS; MEASUREMENT; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; SPECTROSCOPY; SUPERCONDUCTOR;

EID: 84860099737     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.020502     Document Type: Article

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