Angle-scanning photonic crystal enhanced fluorescence microscopy

IEEE Sensors Journal

Volumn 12, Issue 5, 2012, Pages 1272-1279

  Chaudhery, Vikram ^a   Lu, Meng ^b   Pokhriyal, Anusha ^a   Schulz, Stephen C ^b   Cunningham, Brian T ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b SRU Biosystems   (United States)

Author keywords

Fluorescence; microscopy; photonic crystals

Indexed keywords

ANGLE-SCANNING; COLLECTION EFFICIENCY; COLLIMATED PLANE WAVE; COUPLING LIGHT; DEVICE SURFACES; ENHANCED FLUORESCENCE; ENHANCEMENT FACTOR; EXPERIMENTAL MEASUREMENTS; FIXED WAVELENGTH; FLUORESCENCE EMISSION; FLUORESCENCE EXCITATION; FLUORESCENCE IMAGE; FLUORESCENCE MICROSCOPES; FLUORESCENT MOLECULES; INCIDENT ANGLES; LASER SCANNER; NON-UNIFORMITIES; RESONANT EXCITATION; RESONANT WAVELENGTHS; SURFACE BOUNDS;

COMPUTER SIMULATION; FLUORESCENCE; FLUORESCENCE MICROSCOPY; FLUOROPHORES; LIGHT SOURCES; MICROSCOPIC EXAMINATION; OPTICAL DESIGN; OPTIMIZATION;

PHOTONIC CRYSTALS;

EID: 84860015585     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2011.2169401     Document Type: Article

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