Characterizing quantum gates via randomized benchmarking

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 85, Issue 4, 2012, Pages

  Magesan, Easwar ^a   Gambetta, Jay M ^b   Emerson, Joseph ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR RATE; GATE DEPENDENCE; QUANTUM GATES; SUFFICIENT CONDITIONS;

LOGIC GATES; QUANTUM ELECTRONICS;

BENCHMARKING;

EID: 84859805734     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.85.042311     Document Type: Article

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