Randomized benchmarking and process tomography for gate errors in a solid-state qubit

Physical Review Letters

Volumn 102, Issue 9, 2009, Pages

  Chow, J M ^a   Gambetta, J M ^b   Tornberg, L ^c   Koch, Jens ^a   Bishop, Lev S ^a   Houck, A A ^a   Johnson, B R ^a   Frunzio, L ^a   Girvin, S M ^a   Schoelkopf, R J ^a  

^a YALE UNIVERSITY   (United States)

^b UNIVERSITY OF WATERLOO   (Canada)

^c CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; DIAGNOSTIC RADIOGRAPHY; TOMOGRAPHY;

EXPONENTIAL DEPENDENCES; GATE ERRORS; GATE FIDELITIES; NUMBER OF GATES; PROCESS TOMOGRAPHIES; PULSE EXPERIMENTS; QUANTUM PROCESS TOMOGRAPHIES; QUBIT DECOHERENCE; SINGLE-QUBIT GATES; SUPERCONDUCTING QUBIT;

ERRORS;

EID: 63149105997     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.102.090502     Document Type: Article

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