Ancilla-assisted quantum process tomography

Physical Review Letters

Volumn 90, Issue 19, 2003, Pages

  Altepeter, J B ^a   Branning, D ^a   Jeffrey, E ^a   Wei, T C ^a   Kwiat, P G ^a   Thew, R T ^b,c   O'Brien, J L ^b   Nielsen, M A ^b   White, A G ^b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b UNIVERSITY OF QUEENSLAND   (Australia)

^c UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; ELECTRON ENERGY LEVELS; LIGHT POLARIZATION; MATRIX ALGEBRA; MAXIMUM LIKELIHOOD ESTIMATION; OPTICAL FILTERS; PHOTODIODES; PHOTONS; TOMOGRAPHY;

ANCILLA ASSISTED PROCESS TOMOGRAPHY; ENTANGLED STATES; QUANTUM COMPUTER; QUANTUM PROCESS TOMOGRAPHY;

QUANTUM THEORY;

EID: 0037595578     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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