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Volumn 100, Issue 14, 2012, Pages

Automated markerless full field hard x-ray microscopic tomography at sub-50 nm 3-dimension spatial resolution

Author keywords

[No Author keywords available]

Indexed keywords

3-DIMENSION; BROOKHAVEN NATIONAL LABORATORY; FULL-FIELD; HARD X RAY; LOCAL TOMOGRAPHY; MARKERLESS; NATIONAL SYNCHROTRON LIGHT SOURCES; RESEARCH FIELDS; SPATIAL RESOLUTION; SPECTROSCOPIC IMAGING; SUB-50 NM;

EID: 84859802569     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3701579     Document Type: Article
Times cited : (96)

References (23)
  • 11
    • 84859789966 scopus 로고    scopus 로고
    • Xradia Inc., patent pending
    • Xradia Inc., patent pending
  • 12
    • 84859797395 scopus 로고    scopus 로고
    • Xradia Inc., U.S. Patent No. 7,535,193 B2. (U.S. Patent and Trademark Office, Washington, DC, May 19)
    • Xradia Inc., U.S. Patent No. 7,535,193 B2. (U.S. Patent and Trademark Office, Washington, DC, May 19, 2009)
    • (2009)
  • 16
    • 0028469063 scopus 로고
    • 10.1364/JOSAA.11.001985
    • Y. Horikawa, J. Opt. Soc. Am. A 11, 1985 (1994). 10.1364/JOSAA.11.001985
    • (1994) J. Opt. Soc. Am. A , vol.11 , pp. 1985
    • Horikawa, Y.1
  • 19
    • 0001669199 scopus 로고
    • 10.1364/AO.34.004944
    • L. Jochum and W. Meyer-llse, Appl. Opt. 34, 4944 (1995). 10.1364/AO.34.004944
    • (1995) Appl. Opt , vol.34 , pp. 4944
    • Jochum, L.1    Meyer-Llse, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.