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Volumn 20, Issue 7, 2012, Pages 8006-8014

Extreme ultraviolet multilayer for the FERMI@Elettra free electron laser beam transport system

Author keywords

[No Author keywords available]

Indexed keywords

FREE ELECTRON LASERS; REFLECTION;

EID: 84859417720     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.008006     Document Type: Article
Times cited : (31)

References (18)
  • 1
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    • E. Allaria, C. Callegari, D. Cocco, W. M. Fawley, M. Kiskinova, C. Masciovecchio, and F. Parmigiani, "The FERMI@Elettra free-electron-laser source for coherent x-ray physics: photon properties, beam transport system and applications," New J. Phys. 12 (7), 075002 (2010).
    • (2010) New J. Phys. , vol.12 , Issue.7 , pp. 075002
    • Allaria, E.1    Callegari, C.2    Cocco, D.3    Fawley, W.M.4    Kiskinova, M.5    Masciovecchio, C.6    Parmigiani, F.7
  • 7
    • 67649422212 scopus 로고    scopus 로고
    • FEL-based transient grating spectroscopy to investigate nanoscale dynamics
    • F. Bencivenga and C. Masciovecchio, "FEL-based transient grating spectroscopy to investigate nanoscale dynamics," Nucl. Instrum. and Meth. A 606 (3), 785-789 (2009).
    • (2009) Nucl. Instrum. and Meth. A , vol.606 , Issue.3 , pp. 785-789
    • Bencivenga, F.1    Masciovecchio, C.2
  • 9
    • 79958761991 scopus 로고    scopus 로고
    • Thermal and stress studies of normal incidence Mo/B4C multilayers for a 6.7 nm wavelength
    • M. Barthelmess and S. Bajt, "Thermal and stress studies of normal incidence Mo/B4C multilayers for a 6.7 nm wavelength," Appl. Opt. 50 (11), 1610-1619 (2011).
    • (2011) Appl. Opt. , vol.50 , Issue.11 , pp. 1610-1619
    • Barthelmess, M.1    Bajt, S.2
  • 11
    • 70449479041 scopus 로고    scopus 로고
    • Reflective multilayer optics for 6.7nm wavelength radiation sources and next generation lithography
    • T. Tsarfati, R. W. E. Van De Kruijs, E. Zoethout, E. Louis, and F. Bijkerk, "Reflective multilayer optics for 6.7nm wavelength radiation sources and next generation lithography," Thin Solid Films 518 (5), 1365-1368 (2009).
    • (2009) Thin Solid Films , vol.518 , Issue.5 , pp. 1365-1368
    • Tsarfati, T.1    De Van Kruijs, E.R.W.2    Zoethout, E.3    Louis, E.4    Bijkerk, F.5
  • 13
    • 84975534742 scopus 로고
    • Normal-incidence x-ray mirror for 7 nm
    • D. G. Stearns, R. S. Rosen, and S. P. Vernon, "Normal-incidence x-ray mirror for 7 nm," Opt. Lett. 16 (16), 1283-1285 (1991).
    • (1991) Opt. Lett. , vol.16 , Issue.16 , pp. 1283-1285
    • Stearns, D.G.1    Rosen, R.S.2    Vernon, S.P.3
  • 14
    • 0002970203 scopus 로고    scopus 로고
    • Optical constants of in situ-deposited films of important extreme-ultraviolet multilayer mirror materials
    • C. Tarrio, R. N. Watts, T. B. Lucatorto, J. M. Slaughter, and C. M. Falco, "Optical constants of in situ-deposited films of important extreme-ultraviolet multilayer mirror materials," Appl. Opt. 37 (19), 4100-4104 (1998). (Pubitemid 128658781)
    • (1998) Applied Optics , vol.37 , Issue.19 , pp. 4100-4104
    • Tarrio, C.1    Watts, R.N.2    Lucatorto, T.B.3    Slaughter, J.M.4    Falco, C.M.5
  • 15
    • 70350310183 scopus 로고    scopus 로고
    • Extreme-ultraviolet multilayer coatings with high spectral purity for solar imaging
    • M. Suman, M. G. Pelizzo, D. L. Windt, and P. Nicolosi, "Extreme-ultraviolet multilayer coatings with high spectral purity for solar imaging," Appl. Opt. 48 (29), 5432-5437 (2009).
    • (2009) Appl. Opt. , vol.48 , Issue.29 , pp. 5432-5437
    • Suman, M.1    Pelizzo, M.G.2    Windt, D.L.3    Nicolosi, P.4
  • 16
    • 51549101114 scopus 로고    scopus 로고
    • Time degradation of nanosize multilayer Mo/B4C compositions at storage on air
    • I. Kopylets, "Time degradation of nanosize multilayer Mo/B4C compositions at storage on air," Metallofiz. Noveishie Tekhnol. 30, 497-506 (2008).
    • (2008) Metallofiz. Noveishie Tekhnol. , vol.30 , pp. 497-506
    • Kopylets, I.1
  • 17
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    • Nitridation and contrast of B4C/La interfaces and x-ray multilayer optics
    • T. Tsarfati, R. W. E. Van de Kruijs, E. Zoerthout, E. Louis, and F. Bijkerk, "Nitridation and contrast of B4C/La interfaces and x-ray multilayer optics," Thin Solid Films 518 (24), 7249-7252 (2010).
    • (2010) Thin Solid Films , vol.518 , Issue.24 , pp. 7249-7252
    • Tsarfati, T.1    De Van Kruijs, E.R.W.2    Zoerthout, E.3    Louis, E.4    Bijkerk, F.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.