Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study

Journal of Applied Physics

Volumn 110, Issue 11, 2011, Pages

  Neuhold, Alfred ^a   Fladischer, Stefanie ^b   Mitsche, Stefan ^b   Flesch, Heinz Georg ^a   Moser, Armin ^a   Novak, Jiri ^a   Smilgies, Detlef M ^c   Kraker, Elke ^d   Lamprecht, Bernhard ^d   Haase, Anja ^d   Grogger, Werner ^b   Resel, Roland ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^c Department of Obstetrics Gynecology   (United States)

^d JOANNEUM RESEARCH   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPIES (AFM); COPPER PHTHALOCYANINE (CUPC); CRYSTALLOGRAPHIC PROPERTIES; GOLD LAYER; INTERFACE MORPHOLOGIES; INTERFACE ROUGHNESS; INTERNAL MORPHOLOGY; MULTILAYER STACKS; ORGANIC LAYERS; ORGANIC MULTILAYERS; ORGANIC THIN FILMS; ORGANIC/INORGANIC; PERYLENE TETRACARBOXYLIC; RANDOMLY DISTRIBUTED; ROUGH INTERFACES; SILVER ELECTRODE; SMOOTHING LAYERS; STRUCTURE AND MORPHOLOGY; X RAY REFLECTIVITY;

ATOMIC FORCE MICROSCOPY; CRYSTALLITES; INTERFACES (MATERIALS); MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; X RAY DIFFRACTION;

MULTILAYERS;

EID: 84859346779     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3667171     Document Type: Article

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