Electron transport properties of single molecular junctions under mechanical modulations

Journal of Physics Condensed Matter

Volumn 24, Issue 16, 2012, Pages

  Zhou, Jianfeng ^a   Guo, Cunlan ^a   Xu, Bingqian ^a  

^a Driftmier Engineering Center   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; DECAY CONSTANTS; DYNAMIC CONTACTS; ELECTRODE CONTACTS; ELECTRON TRANSPORT; MEASURED DATA; MECHANICAL MODULATION; MOLECULAR JUNCTION; MOLECULE-ELECTRODE CONTACTS; SCANNING PROBES; SINGLE MOLECULAR CONDUCTANCE; TUNNELING BARRIER;

BIPOLAR TRANSISTORS; CONFORMATIONS; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES;

MECHANICAL PROPERTIES;

EID: 84859220162     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/24/16/164209     Document Type: Article

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