Probing local surface conductance using current sensing atomic force microscopy

Review of Scientific Instruments

Volumn 83, Issue 1, 2012, Pages

  Liu, Yucong ^a   He, Jiayu ^b   Kwon, Osung ^a   Zhu, Da Ming ^a  

^a UNIVERSITY OF MISSOURI KANSAS CITY   (United States)

^b SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); CORRELATION LENGTHS; CURRENT SENSING; CURRENT SENSING ATOMIC FORCE MICROSCOPIES; LOCAL SURFACES; MORPHOLOGICAL FEATURES; PROBE TIPS; SAMPLE THICKNESS; SURFACE CONDUCTIVITY; SURFACE FEATURE;

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY;

PROBES;

EID: 84859184130     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3673476     Document Type: Review

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