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Volumn 108, Issue 4, 2010, Pages

Scaling laws for electrical contact resistance with dissimilar materials

Author keywords

[No Author keywords available]

Indexed keywords

CARTESIANS; CONTACT REGIONS; CYLINDRICAL GEOMETRY; ELECTRICAL CONTACT RESISTANCE; ELECTRICAL RESISTIVITY; IDEALIZED MODELS; NUMERICAL SIMULATION; PARAMETER SPACES; PARAMETRIC DEPENDENCE; RESISTIVITY RATIO;

EID: 77956337748     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3457899     Document Type: Conference Paper
Times cited : (35)

References (23)
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  • 5
    • 67650218139 scopus 로고    scopus 로고
    • JAPIAU 0021-8979,. 10.1063/1.3148289
    • Y. Y. Lau and W. Tang, J. Appl. Phys. JAPIAU 0021-8979 105, 124902 (2009). 10.1063/1.3148289
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    • Lau, Y.Y.1    Tang, W.2
  • 6
    • 49949122961 scopus 로고
    • THSFAP 0040-6090, () 10.1016/0040-6090(68)90046-1
    • P. M. Hall, Thin Solid Films THSFAP 0040-6090 1, 277 (1968) 10.1016/0040-6090(68)90046-1
    • (1968) Thin Solid Films , vol.1 , pp. 277
    • Hall, P.M.1
  • 10
    • 0037008487 scopus 로고    scopus 로고
    • SCIEAS 0036-8075,. 10.1126/science.1060928
    • R. H. Baughman, A. A. Zakhidov, and W. A. de Heer, Science SCIEAS 0036-8075 297, 787 (2002). 10.1126/science.1060928
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  • 11
    • 4143083996 scopus 로고    scopus 로고
    • in, edited by R. J. Barker, J. H. Booske, N. C. Luhmann, and G. S. Nusinovich (IEEE, Piscataway, NJ), Cha,;, Appl. Phys. Lett. APPLAB 0003-6951, 144102 (2007). 10.1063/1.2794762
    • D. Shiffler, T. K. Statum, T. W. Hussey, O. Zhou, and P. Mardahl, in Modern Microwave and Millimeter Wave Power Electronics, edited by, R. J. Barker, J. H. Booske, N. C. Luhmann, and, G. S. Nusinovich, (IEEE, Piscataway, NJ, 2005), Chap., p. 691; V. Vlahos, J. H. Booske, and D. Morgan, Appl. Phys. Lett. APPLAB 0003-6951 91, 144102 (2007). 10.1063/1.2794762
    • (2005) Modern Microwave and Millimeter Wave Power Electronics , vol.91 , pp. 691
    • Shiffler, D.1    Statum, T.K.2    Hussey, T.W.3    Zhou, O.4    Mardahl, P.5    Vlahos, V.6    Booske, J.H.7    Morgan, D.8
  • 14
  • 22
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    • http://www.ansoft.com
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    • 4th ed. (Cambridge University Press, Cambridge, UK), and 385.
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    • Whittaker, E.T.1    Watson, G.N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.