High-resolution imaging of ion conductivity of Nafion® membranes with electrochemical atomic force microscopy

Electrochimica Acta

Volumn 55, Issue 2, 2009, Pages 423-429

  Hiesgen, R ^a   Aleksandrova, E ^b   Meichsner, G ^a   Wehl, I ^a   Roduner, E ^b   Friedrich, K A ^c  

^a ESSLINGEN UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

^c GERMAN AEROSPACE CENTER DLR   (Germany)

Author keywords

Electrochemical AFM; Ionic cluster; Nafion; Proton conductivity; Structure

Indexed keywords

AFM IMAGE; BULK STRUCTURE; CHARACTERISATION; COMPLEX NATURE; CONCENTRATION OF; CONDUCTIVE CHANNELS; CONDUCTIVITY CHANGES; CURRENT IMAGE; DYNAMIC BEHAVIOURS; ELECTRICAL MODELS; ELECTROCHEMICAL AFM; ELECTROCHEMICAL ATOMIC FORCE MICROSCOPY; HIGH CURRENTS; HIGH-RESOLUTION IMAGING; HIGHER ORDER; HYDROPHILIC AND HYDROPHOBIC; INTERNAL STRUCTURE; INVERTED MICELLES; ION CONDUCTIVITIES; IONIC CLUSTER; LOCAL FLUCTUATIONS; LOCAL VARIATIONS; MEMBRANE SURFACE; NAFION; NANOSCALE REGIONS; ORDERED STRUCTURES; ROOM TEMPERATURE; SELF-ASSEMBLING PROCESS; SOLIDIFICATION PROCESS; STRUCTURAL FEATURE; STRUCTURE; SUPER-STRUCTURES; SURFACE CONDUCTIVITY; SURFACE ENERGIES; SURFACE FREE ENERGY; TEMPERATURE VARIATION;

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; MEMBRANES; PROTON CONDUCTIVITY; SOLIDIFICATION; SURFACE CHEMISTRY; SURFACE TENSION;

SURFACE STRUCTURE;

EID: 70350440537     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2009.05.049     Document Type: Article

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