SCOPUS 정보 검색 플랫폼

Journal of Electron Spectroscopy and Related Phenomena

Volumn 185, Issue 3-4, 2012, Pages 112-118

XPS studies on surface reduction of tungsten oxide nanowire film by Ar + bombardment

(8) Xie, F Y a Gong, L a Liu, X a Tao, Y T a Zhang, W H a Chen, S H a Meng, H a Chen, J a

a SUN YAT SEN UNIVERSITY (China)

Author keywords

Ar ion bombardment; Ion induced reduction; Tungsten oxide; X ray photoelectron spectroscopy

Indexed keywords

CONE ARRAYS; ETCHING MASKS; EX SITU; HIGH ENERGY; IN-SITU; INTERMEDIATE CHEMICALS; ION BEAM BOMBARDMENT; MORPHOLOGICAL EVOLUTION; MULTIPLE OXIDATION; NANOWIRE FILMS; SEM IMAGE; SURFACE CHEMICAL STATE; SURFACE REDUCTION; TUNGSTEN OXIDE; TUNGSTEN OXIDE NANOWIRES;

ARGON; ELECTRONIC STRUCTURE; ION BOMBARDMENT; NANOWIRES; OXIDES; PHOTOELECTRONS; SCANNING ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

TUNGSTEN;

EID: 84859183225 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2012.01.004 Document Type: Article

Times cited : (308)

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