An XPS study on the surface reduction of V2O5(0 0 1) induced by Ar+ ion bombardment

Surface Science

Volumn 600, Issue 17, 2006, Pages 3512-3517

  Silversmit, Geert ^a   Depla, Diederik ^a   Poelman, Hilde ^a   Marin, Guy B ^a   De Gryse, Roger ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

V2p photoelectron core level; V2O5(0 0 1); Vanadium oxidation state; Vanadium oxide; X ray photoelectron spectroscopy (XPS); XPS analysis

Indexed keywords

CRYSTAL STRUCTURE; ION BOMBARDMENT; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

PHOTOLINES; SURFACE REDUCTION; VANADIUM OXIDE;

VANADIUM COMPOUNDS;

EID: 33748300570     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.07.006     Document Type: Article

References (9)

1. Silversmit G., Depla D., Poelman H., Marin G.B., and De Gryse R. J. Electron Spectrosc. Relat. Phenom. 135 (2004) 167
2. Betz G., and Wehner G.K. In: Behrisch R. (Ed). Sputtering by Particle Bombardment II (1983), Springer-Verlag, Berlin 11
3. Haemers J. Bull. Soc. Chim Belges 79 (1970) 473
4. http://www.phy.cuhk.edu.hk/~surface/xpspeak/.
5. Zimmerman R., Claessen R., Reinert F., Steiner P., and Hüfner S. J. Phys. Condens. Matter 10 (1998) 5697
6. Mendialdua J., Casanova R., and Barbaux Y. J. Electron. Spectrosc. Relat. Phenom. 71 (1995) 249
7. In: Briggs D., and Grant J.T. (Eds). Surface Analysis by Auger and X-ray Photoelectron Spectroscopy (2003), IM Publications and Surface Spectra Limited
8. Landolt Börnstein, III 17g, Springer-Verlag 1984, p. 180.
9. Naguib H.M., and Kelly R. J. Phys. Chem. Solids 33 (1972) 1751