Sample preserving deep interface characterization technique

Physical Review Letters

Volumn 97, Issue 26, 2006, Pages

  Holmstrom E ^a   Olovsson, W ^b   Abrikosov, I A ^c   Niklasson, A M N ^a,d   Johansson, B ^d,e   Gorgoi, M ^f   Karis, O ^e   Svensson, S ^e,f   Schafers F ^f   Braun, W ^f   Ohrwall G ^e   Andersson, G ^e   Marcellini, M ^e   Eberhardt, W ^f  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b KYOTO UNIVERSITY   (Japan)

^c LINKÖPING UNIVERSITY   (Sweden)

^d ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^e UPPSALA UNIVERSITY   (Sweden)

^f HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; BINDING ENERGY; INTERFACES (MATERIALS); NONDESTRUCTIVE EXAMINATION; PROBABILITY DENSITY FUNCTION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

BURIED INTERFACES; CORE LEVEL SPECTROSCOPY; INTERFACE CHARACTERIZATION TECHNIQUES; INTERMIXING;

NANOSTRUCTURED MATERIALS;

EID: 33846395108     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.97.266106     Document Type: Article

References (24)

1. E. Holmström, L. Nordström, L. Bergqvist, B. Skubic, B. Hjörvarsson, I.A. Abrikosov, P. Svedlindh, and O. Eriksson, Proc. Natl. Acad. Sci. U.S.A. PNASA6 0027-8424 101, 4742 (2004). 10.1073/pnas.0305313101
2. S.S.P. Parkin, Phys. Rev. Lett. 71, 1641 (1993). PRLTAO 0031-9007 10.1103/PhysRevLett.71.1641
3. S. Zhang and P.M. Levy, Phys. Rev. Lett. 81, 5660 (1998). PRLTAO 0031-9007 10.1103/PhysRevLett.81.5660
4. J. Barnas and A. Fert, Phys. Rev. Lett. 80, 1058 (1998). PRLTAO 0031-9007 10.1103/PhysRevLett.80.1058
5. S. Yuasa, T. Nagahama, and Y. Suzuki, Science 297, 234 (2002). SCIEAS 0036-8075 10.1126/science.1071300
6. S. Zhang and P.M. Levy, Phys. Rev. B PRBMDO 0163-1829 57, 5336 (1998). 10.1103/PhysRevB.57.5336
7. J. Spence, Mater. Sci. Eng., R MIGIEA 0927-796X 26, 1 (1999). 10.1016/S0927-796X(99)00005-4
8. H. Zabel, Appl. Phys. A 58, 159 (1994). APSFDB 0721-7250 10.1007/BF00324371
9. Z. Mai, G. Luo, C. Liu, M. Li, H. Jiang, W. Lai, J. Wang, Y. Ding, T. Hase, and B. Fulthorpe, Nucl. Instrum. Methods Phys. Res., Sect. B NIMBEU 0168-583X, 199, 494 (2003). 10.1016/S0168-583X(02)01416-7
10. W.J. Kaiser and L.D. Bell, Phys. Rev. Lett. 60, 1406 (1988). PRLTAO 0031-9007 10.1103/PhysRevLett.60.1406
11. T. Meyer and H. vonKänel, Phys. Rev. Lett. 78, 3133 (1997). PRLTAO 0031-9007 10.1103/PhysRevLett.78.3133
12. S. Hüfner, Photoelectron Spectroscopy, Advanced Texts in Physics (Springer, New York, 2003), 3rd ed.
13. W. Olovsson, E. Holmström, J. Wills, P. James, I.A. Abrikosov, and A.M.N. Niklasson, Phys. Rev. B PRBMDO 0163-1829 72, 155419 (2005). 10.1103/PhysRevB.72.155419
14. B. Johansson and N. MÃ¥rtensson, Phys. Rev. B PRBMDO 0163-1829 21, 4427 (1980), and references therein. 10.1103/PhysRevB.21.4427
15. A. Flodström, R. Nyholm, and B. Johansson, in Synchrotron Radiation Research: Advances in Surface and Interface Science, edited by, R.Z. Bachrach, (Plenum Press, New York, 1992), Vol.A 1, p.A 199, and references therein.
16. E. Holmström, Ph.D. thesis, Uppsala University, 2003;
17. http://publications.uu.se
18. T. Mewes, M. Rickart, A. Mougin, S. Demokritov, J. Fassbender, B. Hillebrands, and M. Scheib, Surf. Sci. 481, 87 (2001). SUSCAS 0039-6028 10.1016/S0039-6028(01)01000-7
19. F. Schäfers (to be published).
20. C.J. Powell and A. Jablonski, Nist Electron Inelastic-Mean-Free-Path Databaseâ€"Version 1.1 (National Institute of Standards and Technology, Gaithersburg, MD, 2000).
21. H.L. Skriver and N.M. Rosengaard, Phys. Rev. B PRBMDO 0163-1829 43, 9538 (1991). 10.1103/PhysRevB.43.9538
22. I.A. Abrikosov and H.L. Skriver, Phys. Rev. B PRBMDO 0163-1829 47, 16-532 (1993). 10.1103/PhysRevB.47.16532
23. A.V. Ruban and H.L. Skriver, Comput. Mater. Sci. CMMSEM 0927-0256 15, 119 (1999). 10.1016/S0927-0256(99)00003-8
24. I.A. Abrikosov, W. Olovsson, and B. Johansson, Phys. Rev. Lett. 87, 176403 (2001). PRLTAO 0031-9007 10.1103/PhysRevLett.87.176403