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Volumn , Issue , 2008, Pages 1605-1608
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Modeling of force-volume images in atomic force microscopy
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Author keywords
Atomic force microscopy (AFM); Convolutive mixture of signals; Force volume imaging; Tridimensional signals
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Indexed keywords
ATOMIC PHYSICS;
ATOMS;
IMAGE ENHANCEMENT;
IMAGE SEGMENTATION;
SCANNING PROBE MICROSCOPY;
SIGNAL PROCESSING;
TECHNICAL PRESENTATIONS;
ATOMIC FORCE MICROSCOPY (AFM);
CONVOLUTIVE MIXTURE OF SIGNALS;
FORCE-VOLUME IMAGING;
TRIDIMENSIONAL SIGNALS;
VOLUME IMAGING;
ATOMIC FORCE MICROSCOPY;
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EID: 51049099148
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISBI.2008.4541319 Document Type: Conference Paper |
Times cited : (4)
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References (7)
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