On the νsiO infrared absorption of polysiloxane films

Thin Solid Films

Volumn 520, Issue 11, 2012, Pages 3918-3921

  Chazalviel, J N ^a   Rodrigues Filho, U P ^b  

^a LABORATOIRE DE PHYSIQUE DE LA MATIÈRE CONDENSÉE   (France)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Attenuated total reflection; Internal reflection; Polysiloxanes; Quantitative infrared spectroscopy; Thin films

Indexed keywords

ANTISYMMETRIC VIBRATIONS; ATTENUATED TOTAL REFLECTIONS; DIPOLAR INTERACTION; INTERNAL REFLECTIONS; LONGITUDINAL-TRANSVERSE SPLITTING; ORIENTATIONAL ORDERINGS; POLARIZATION DEPENDENCE; POLYSILOXANE FILMS; RELATIVE INTENSITY; THEORETICAL FRAMEWORK; TWO-COMPONENT;

CRYSTALLINE MATERIALS; INFRARED SPECTROSCOPY; SILANES; SILICONES; THIN FILMS;

INFRARED ABSORPTION;

EID: 84858334387     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.01.046     Document Type: Article

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