Analytical estimation of liquid film thickness in two-phase annular flow using electrical resistance measurement

Applied Mathematical Modelling

Volumn 36, Issue 7, 2012, Pages 2833-2840

  Wang, Rongli ^a   Lee, Bo An ^a   Lee, Jeong Seong ^a   Kim, Kyung Youn ^a   Kim, Sin ^a  

^a Jeju National University   (South Korea)

Author keywords

Annular flow; Conformal mapping; Liquid film thickness; Resistance; Two phase flow; Void fraction

Indexed keywords

ANALYTIC SOLUTION; ANALYTICAL ESTIMATIONS; ANALYTICAL SOLUTIONS; ANNULAR FLOWS; CIRCULAR PIPE; ECCENTRIC ANNULAR; ELECTRICAL RESISTANCE MEASUREMENT; ELECTRICAL RESISTANCE TOMOGRAPHY; ESTIMATED ERROR; GAS LIQUID FLOWS; RESISTANCE VALUES; THICKNESS ESTIMATION;

CONFORMAL MAPPING; ELECTRIC RESISTANCE; LIQUID FILMS; THICKNESS MEASUREMENT; VOID FRACTION;

TWO PHASE FLOW;

EID: 84858334176     PISSN: 0307904X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apm.2011.09.069     Document Type: Article

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