Planar laser-induced fluorescence (PLIF) measurements of liquid film thickness in annular flow. Part I: Methods and data

International Journal of Multiphase Flow

Volumn 36, Issue 10, 2010, Pages 815-824

  Schubring, D ^a,b   Ashwood, A C ^b,c   Shedd, T A ^b   Hurlburt, E T ^d  

^a UNIVERSITY OF FLORIDA   (United States)

^b UNIVERSITY OF WISCONSIN MADISON   (United States)

^c NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^d BETTIS ATOMIC POWER LABORATORY   (United States)

Author keywords

Annular flow; Film thickness; Fluorescence; Vertical flow

Indexed keywords

AIR-WATER; ANNULAR FLOW; ANNULAR FLOWS; CONDUCTANCE PROBE; DECREASING FUNCTIONS; DIRECT VISUALIZATION; GAS FLOWS; INCREASING FUNCTIONS; INTERFACIAL SHEAR; LIQUID FLOW; PLANAR LASER INDUCED FLUORESCENCE; PRESSURE LOSS; ROUGH SURFACES; STANDARD DEVIATION; THIN LIQUID FILM; VERTICAL FLOWS;

FLUORESCENCE; LASER PRODUCED PLASMAS; LIQUID FILMS; STATISTICS; VISUALIZATION;

MAGNETIC FILMS;

EID: 77955510885     PISSN: 03019322     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijmultiphaseflow.2010.05.007     Document Type: Article

References (19)

1. Asali J.C., Hanratty T.J., Andreussi P. Interfacial drag and film height for vertical annular flow. AIChE J. 1985, 31:895-902.
2. Brown R.C., Andruessi P., Zanelli S. The use of wire probes for the measurement of liquid film thickness in annular gas-liquid flows. Can. J. Chem. Eng. 1978, 56:754-757.
3. Clark W.W. Liquid film thickness measurement. Multiphase Sci. Technol. 2002, 14:1-74.
4. Fore L.B., Beus S.G., Bauer R.C. Interfacial friction in gas-liquid annular flow: analogies to full and transition roughness. Int. J. Multiphase Flow 2000, 26:1755-1769.
5. Fossa M. Design and performance of a conductance probe for measuring the liquid fraction in two-phase gas-liquid flows. Flow Measur. Instrum. 1998, 9:103-109.
6. Hewitt G.F., Hall Taylor N.S. Annular Two-Phase Flow 1970, Pergamon Press, Oxford, UK.
7. Hewitt G.F., Jayanti S., Hope C.B. Structure of thin liquid films in gas-liquid horizontal flow. Int. J. Multiphase Flow 1990, 16:951-957.
8. Hurlburt, E.T., Fore, L.B., Bauer, R.C., 2006. A two zone interfacial shear stress and liquid film velocity model for vertical annular two-phase flow. In: Proceedings of the ASME Fluids Engineering Division Summer Meeting 2006, vol. 2, Miami, FL, USA, pp. 677-684.
9. Ishii, M., Mishima, K., 1981. Correlation for liquid entrainment in annular two-phase flow of low viscous fluid. Argonne National Laboratory Report ANL/RA/LWR 81-2.
10. Kataoka I., Ishii M., Nakayama A. Entrainment and deposition rates of droplets in annular two-phase flow. Int. J. Heat Mass Transfer 2000, 43:1573-1589.
11. Kishore B.N., Jayanti S. A multidimensional model for annular gas-liquid flow. Chem. Eng. Sci. 2004, 59:3577-3589.
12. Owen, D.G., Hewitt, G.F., 1987. An improved annular two-phase flow model. In: 3rd International Conference on Multi-Phase Flow, The Hague, Netherlands, pp. 73-84.
13. Rodríguez, D.J., Shedd, T.A., 2004. Cross-sectional imaging of the liquid film in horizontal two-phase annular flow. In: 2004 ASME Heat Transfer/Fluids Engineering Summer Conference, Charlotte, NC. Paper 56445.
14. Rodríguez, D.J., 2004. Characterization of bubble entrainment, interfacial roughness and the sliding bubble mechanism in horizontal annular flow. PhD thesis, University of Wisconsin-Madison, Madison, WI, USA.
15. Schubring D., Shedd T.A. Prediction of wall shear for horizontal annular air-water flow. Int. J. Heat Mass Transfer 2008, 52:200-209.
16. Schubring D., Shedd T.A., Hurlburt E.T. Studying disturbance waves in vertical annular flow with high-speed video. Int. J. Multiphase Flow 2010, 36:385-396.
17. Schubring D., Shedd T.A., Hurlburt E.T. Planar laser-induced fluorescence (PLIF) measurements of liquid film thickness in annular flow. Part II: interpretation and modeling. Int. J. Multiphase Flow 2010, 36:825-835.
18. Wallis G.B. One-Dimensional Two-Phase Flow 1969, McGraw-Hill Inc., New York, NY, USA.
19. Wolf A., Jayanti S., Hewitt G.F. Flow development in vertical annular flow. Chem. Eng. Sci. 2001, 56:3221-3235.