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Volumn 15, Issue 2, 2011, Pages 117-124

Measurement of annular liquid film thickness in an open-end swirl injector

Author keywords

Conductance method; Dynamic measurement; Liquid film thickness; Open end swirl injector

Indexed keywords

ANNULAR LIQUID FILMS; CONDUCTANCE METHOD; DYNAMIC MEASUREMENT; ELECTRICAL CONDUCTANCE; EMPIRICAL EQUATIONS; LIQUID OXYGEN; LOCK-IN AMPLIFIER; MEASUREMENT METHODS; MODIFIED EQUATION; OPEN-END SWIRL INJECTOR; POROUS TITANIUM; RAPID VARIATION; SIGNAL PROCESSING CIRCUITS; STEADY CONDITIONS; SWIRL INJECTORS; THEORETICAL EQUATION;

EID: 79951549687     PISSN: 12709638     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ast.2010.06.006     Document Type: Article
Times cited : (77)

References (13)
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    • Kim, S.1    Khil, T.2    Kim, D.3    Yoon, Y.4
  • 9
    • 0018313215 scopus 로고
    • PRESSURE DROP, MEAN FILM THICKNESS AND ENTRAINMENT IN DOWNWARD TWO-PHASE FLOW
    • DOI 10.1016/0300-9467(79)80116-1
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.