Error analysis of EXAFS measurements

Journal of Synchrotron Radiation

Volumn 6, Issue 3, 1999, Pages 302-303

  Krappe, H J ^a   Rossner, H H ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Bayesian approach; Error analysis; FEFF code

Indexed keywords

EID: 0033437125     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049598018172     Document Type: Article

References (2)

1. Rehr, J.J. et al. (1991). J. Am. Chem. Soc. 113, 5135-5140
2. Turchin, V.F. et al. (1971). Sov. Phys. Usp. 13, 681-840