Accurate and scalable IO buffer macromodel based on surrogate modeling

IEEE Transactions on Components, Packaging and Manufacturing Technology

Volumn 1, Issue 8, 2011, Pages 1240-1249

  Zhu, Ting ^a   Steer, Michael B ^a   Franzon, Paul D ^a  

^a North Carolina State University   (United States)

Author keywords

IBIS; input output buffer modeling; macromodel; process voltagetemperature variations; surrogate modeling

Indexed keywords

IBIS; INPUT/OUTPUT; MACRO MODEL; PROCESS-VOLTAGETEMPERATURE VARIATIONS; SURROGATE MODELING;

SCALABILITY;

EID: 84858198552     PISSN: 21563950     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCPMT.2011.2138704     Document Type: Article

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