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Volumn , Issue , 2011, Pages 2119-2130

Towards a supply chain simulation reference model for the semiconductor industry

Author keywords

[No Author keywords available]

Indexed keywords

BACK-END FACILITIES; BUILDING BLOCKES; COMPUTATIONAL BURDEN; CYCLE TIME; FULL MODEL; LEVEL OF DETAIL; POTENTIAL APPLICATIONS; REDUCTION TECHNIQUES; REFERENCE MODELS; SEMICONDUCTOR INDUSTRY; SEMICONDUCTOR SUPPLIES; SUPPLY CHAIN SIMULATION;

EID: 84858033974     PISSN: 08917736     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WSC.2011.6147925     Document Type: Conference Paper
Times cited : (24)

References (20)
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    • Asmundsson, J., R. L. Rardin, and R. Uzsoy. 2006. "Tractable Nonlinear Production Planning Models for Semiconductor Wafer Fabrication Facilities." IEEE Transactions on Semiconductor Manufacturing 19(1):95-111. (Pubitemid 43269770)
    • (2006) IEEE Transactions on Semiconductor Manufacturing , vol.19 , Issue.1 , pp. 95-111
    • Asmundsson, J.1    Rardin, R.L.2    Uzsoy, R.3
  • 8
    • 1642477866 scopus 로고    scopus 로고
    • Semiconductor Supply Network Simulation
    • edited by S. E. Chick, P. J. Sanchez, D. M. Ferrin, and D. J. Morrice, Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
    • Godding, G., H. S. Sarjoughian, and K. G. Kempf. 2003. "Semiconductor Supply Network Simulation."In Proceedings of the 2003 Winter Simulation Conference, edited by S. E. Chick, P. J. Sanchez, D. M. Ferrin, and D. J. Morrice, 1593-1601. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
    • (2003) Proceedings of the 2003 Winter Simulation Conference , pp. 1593-1601
    • Godding, G.1    Sarjoughian, H.S.2    Kempf, K.G.3
  • 11
    • 0032272320 scopus 로고    scopus 로고
    • The Value of Simulation in Modeling Supply Chains
    • edited by D. J. Medeiros, E. F. Watson, J. S. Carson, and M. S. Manivannan, Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
    • Ingalls, R. 1998. "The Value of Simulation in Modeling Supply Chains." In Proceedings of the 1998 Winter Simulation Conference, edited by D. J. Medeiros, E. F. Watson, J. S. Carson, and M. S. Manivannan, 1371-1375. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
    • (1998) Proceedings of the 1998 Winter Simulation Conference , pp. 1371-1375
    • Ingalls, R.1
  • 12
    • 0033348916 scopus 로고    scopus 로고
    • Criticality of Detailed Modeling in Semiconductor Supply Chain Simulation
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    • Jain, S., C.-C. Lim, B.-P. Gan, and Y.-H. Low. 1999. "Criticality of Detailed Modeling in Semiconductor Supply Chain Simulation." In Proceedings of the 1999 Winter Simulation Conference, edited by P. A. Farrington, H. B. Nembhard, D. T. Sturrock, and G. W. Evans, 888-896. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
    • (1999) Proceedings of the 1999 Winter Simulation Conference , pp. 888-896
    • Jain, S.1    Lim, C.-C.2    Gan, B.-P.3    Low, Y.-H.4
  • 13
    • 44649168654 scopus 로고    scopus 로고
    • A Conceptual Framework for Supply Chain Modelling and Simulation
    • Jain, S. 2006. "A Conceptual Framework for Supply Chain Modelling and Simulation." International Journal of Simulation and Process Modelling 2(3/4):154-167.
    • (2006) International Journal of Simulation and Process Modelling , vol.2 , Issue.3-4 , pp. 154-167
    • Jain, S.1
  • 16
    • 84858059010 scopus 로고    scopus 로고
    • MASM Accessed June 1, 2011
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  • 17
    • 84858062612 scopus 로고    scopus 로고
    • Architecture for Simulation-Based Performance Assessment of Planning Approaches in Semiconductor Manufacturing
    • edited by B. Johansson, S. Jain, J. Montoya-Torres, J. Hugan, and E. Yücesan, Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
    • Ponsignon, T., and L. Mönch. 2010. "Architecture for Simulation-Based Performance Assessment of Planning Approaches in Semiconductor Manufacturing." In Proceedings of the 2010 Winter Simulation Conference, edited by B. Johansson, S. Jain, J. Montoya-Torres, J. Hugan, and E. Yücesan, 341-349. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.