Design and characterization of terahertzabsorbing nano-laminates of dielectric and metal thin films

Optics Express

Volumn 18, Issue 14, 2010, Pages 14488-14495

  Bolakis, C ^a   Grbovic, D ^a   Lavrik, N V ^b   Karunasiri, G ^a  

^a NAVAL POSTGRADUATE SCHOOL   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG REFLECTORS; CHROMIUM; COMPOSITE FILMS; FINITE ELEMENT METHOD; FOURIER TRANSFORM INFRARED SPECTROSCOPY; METALLIC FILMS; REFLECTION; TERAHERTZ SPECTROSCOPY;

ABSORPTION CHARACTERISTICS; DIELECTRIC BRAGG REFLECTORS; MULTILAYER STACKS; OPTICAL READOUT; SILICON SUBSTRATES; TERAHERTZ SENSORS; THIN FILM COMPOSITES; THIN FILM STACKS;

THIN FILMS;

EID: 84857984915     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.014488     Document Type: Article

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