Generalization of the Rouard method to an absorbing thin-film stack and application to surface plasmon resonance

Applied Optics

Volumn 45, Issue 33, 2006, Pages 8419-8423

  Lecaruyer, Pierre ^a   Maillart, Emmanuel ^a   Canva, Michael ^a   Rolland, Jannick ^a,b  

^a UNIV PARIS SUD   (France)

^b UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; INTEGRATED CIRCUITS; LIGHT REFLECTION; OPTIMIZATION; SURFACE PLASMON RESONANCE;

METAL THICKNESSES; MULTIDIMENSIONAL SENSORS; ROUARD APPROACH;

THIN FILMS;

ALGORITHM; ARTICLE; ARTIFICIAL MEMBRANE; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; INSTRUMENTATION; LIGHT; METHODOLOGY; RADIATION DOSE; REFRACTOMETRY; SURFACE PLASMON RESONANCE;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; LIGHT; MEMBRANES, ARTIFICIAL; RADIATION DOSAGE; REFRACTOMETRY; SURFACE PLASMON RESONANCE;

EID: 33847028031     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.008419     Document Type: Article

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