Nonuniform current and spin accumulation in a 1 μm thick n-GaAs channel

Applied Physics Letters

Volumn 100, Issue 9, 2012, Pages

  Endres, B ^a   Ciorga, M ^a   Wagner, R ^a   Ringer, S ^a   Utz, M ^a   Bougeard, D ^a   Weiss, D ^a   Back, C H ^a   Bayreuther, G ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT EDGES; CROSS-SECTIONAL IMAGING; DRIFT-DIFFUSION MODEL; ELECTRON DRIFT; GAAS; MAXIMUM CURRENT DENSITY; NONUNIFORM CURRENT; ONE-DIMENSIONAL MODEL; SPIN DIFFUSIONS; SPIN DISTRIBUTION; SPIN LIFETIMES; SPIN-ACCUMULATIONS;

GALLIUM ARSENIDE; MANGANESE; SPIN DYNAMICS; SPIN POLARIZATION;

SEMICONDUCTING GALLIUM;

EID: 84857969828     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3691175     Document Type: Article

References (14)

1. I. Žuti, J. Fabian, and S. Das Sarma, Rev. Mod. Phys. 76, 323 (2004). 10.1103/RevModPhys.76.323
2. J. Fabian, A. Matos-Abiague, C. Ertler, P. Stano, and I. Žuti, Acta Phys. Slov. 57, 565 (2007). 10.2478/v10155-010-0086-8
3. M. Ciorga, A. Einwanger, U. Wurstbauer, D. Schuh, W. Wegscheider, and D. Weiss, Phys. Rev. B 79, 165321 (2009). 10.1103/PhysRevB.79.165321
4. X. Lou, C. Adelmann, S. A. Crooker, E. S. Garlid, J. Zhang, K. S. M. Reddy, S. D. Flexner, C. J. Palmstrm, and P. A. Crowell, Nat. Phys. 3, 197 (2007). 10.1038/nphys543
5. M. Furis, D. L. Smith, S. Kos, E. S. Garlid, K. S. M. Reddy, C. J. Palmstrm, P. A. Crowell, and S. A. Crooker, New J. Phys. 9, 347 (2007). 10.1088/1367-2630/9/9/347
6. C. Awo-Affouda, O. M. J. van't Erve, G. Kioseoglou, A. T. Hanbicki, M. Holub, C. H. Li, and B. T. Jonker, Appl. Phys. Lett. 94, 102511 (2009). 10.1063/1.3097012
7. A. Fuhrer, S. F. Alvarado, G. Salis, and R. Allenspach, Appl. Phys. Lett. 98, 202104 (2011). 10.1063/1.3590726
8. P. Kotissek, M. Bailleul, M. Sperl, A. Spitzer, D. Schuh, W. Wegscheider, C. H. Back, and G. Bayreuther, Nat. Phys. 3, 872 (2007). 10.1038/nphys734
9. B. Endres, F. Hoffmann, C. Wolf, A. Einwanger, M. Utz, D. Schuh, G. Woltersdorf, M. Ciorga, D. Weiss, C. H. Back, J. Appl. Phys. 109, 07C505 (2011). 10.1063/1.3553932
10. M. Ciorga, C. Wolf, A. Einwanger, M. Utz, D. Schuh, and D. Weiss, AIP Adv. 1, 22113 (2011). 10.1063/1.3591397
11. See supplementary material at http://dx.doi.org/10.1063/1.3691175 E-APPLAB-100-039210 for a detailed description of the fitting procedure.
12. R. I. Dzhioev, K. V. Kavokin, V. L. Korenev, M. V. Lazarev, B. Y. Meltser, M. N. Stepanova, B. P. Zakharchenya, D. Gammon, and D. S. Katzer, Phys. Rev. B 66, 245204 (2002). 10.1103/PhysRevB.66.245204
13. M. Beck, C. Metzner, S. Malzer, and G. H. Döhler, Europhys. Lett. 75, 597 (2006). 10.1209/epl/i2006-10151-4
14. M. Furis, D. L. Smith, S. A. Crooker, and J. L. Reno, Appl. Phys. Lett. 89, 102102 (2006). 10.1063/1.2345608