Microstructural characterization of electrically failed conductive traces printed from Ag nanoparticle inks

Materials Letters

Volumn 76, Issue , 2012, Pages 51-54

  Roberson, David A ^a   Wicker, Ryan B ^a   MacDonald, Eric ^a  

^a 500 W University Avenue   (United States)

Author keywords

Inkjet Printing; Microstructure; Nanoparticle ink; SEM; Sintering

Indexed keywords

AG NANOPARTICLE; ELECTRICAL CURRENT; FAILURE MECHANISM; MICRO-STRUCTURAL CHARACTERIZATION; NON-HOMOGENEOUS; SILVER INKS; SIMPLE PHYSICAL MODELS; SINTERED PARTICLES; SUBSTRATE DAMAGE;

INK; MICROSTRUCTURE; NANOPARTICLES; SCANNING ELECTRON MICROSCOPY; SINTERING;

SILVER;

EID: 84857962135     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2012.02.032     Document Type: Article

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