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Applied Physics Letters

Volumn 100, Issue 8, 2012, Pages

Stabilization of mixed-phase structures in highly strained BiFeO 3 thin films via chemical-alloying

(4) Damodaran, Anoop R a Breckenfeld, Eric a Choquette, Amber K a Martin, Lane W a

a University of Illinois at Urbana Champaign (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; BULK-LIKE; ELECTROMECHANICAL RESPONSE; EPITAXIAL BREAKDOWN; HIGH RESOLUTION X RAY DIFFRACTION; HIGHLY STRAINED; RECIPROCAL SPACE MAPPING; SURFACE DISPLACEMENT;

ALLOYING; ELECTRIC FIELDS; EPITAXIAL FILMS; EPITAXIAL GROWTH; PHASE STRUCTURE; X RAY DIFFRACTION;

BISMUTH COMPOUNDS;

EID: 84857693652 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3688175 Document Type: Article

Times cited : (16)

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