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Physical Review B - Condensed Matter and Materials Physics

Volumn 85, Issue 2, 2012, Pages

Temperature and thickness evolution and epitaxial breakdown in highly strained BiFeO 3 thin films

(5) Damodaran, Anoop R a Lee, Sungki a Karthik, J a MacLaren, Scott b Martin, Lane W a

a University of Illinois at Urbana Champaign (United States)

b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84860752594 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.85.024113 Document Type: Article

Times cited : (66)

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