Simultaneous measurement of the in-and across-plane ionic conductivity of YSZ thin films

Journal of the Electrochemical Society

Volumn 159, Issue 4, 2012, Pages

  Navickas, E ^a,b   Gerstl, M ^a   Kubel, F ^a   Fleig, J ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b KAUNAS UNIVERSITY OF TECHNOLOGY   (Lithuania)

Author keywords

[No Author keywords available]

Indexed keywords

BLOCKING EFFECT; BULK CONDUCTIVITIES; CURRENT FLOWS; DC RESISTANCE; FREQUENCY DEPENDENT CURRENT; HIGH FREQUENCY; IMPEDANCE SPECTRUM; IN-PLANE; IN-PLANE CONDUCTIVITY; LOW FREQUENCY; MEASUREMENT GEOMETRY; SILICA INTERLAYERS; SILICA LAYERS; SILICON SUBSTRATES; SIMULTANEOUS MEASUREMENT; STRIPE ELECTRODES; YSZ FILMS; YSZ THIN FILMS; YTTRIA-STABILIZED ZIRCONIA THIN FILMS;

ACTIVATION ENERGY; GRAIN BOUNDARIES; IONIC CONDUCTIVITY; PULSED LASER DEPOSITION; SILICA;

THIN FILMS;

EID: 84857415349     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/2.081204jes     Document Type: Article

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