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Journal of Physics Condensed Matter

Volumn 24, Issue 9, 2012, Pages

Structural characterization of epitaxial Cr xMo 1-x alloy thin films

(8) Kaspar, T C a Bowden, M E b Varga, T b Wang, C M b Shutthanandan, V b Joly, A G a Wirth, B D c Kurtz, R J a

a PACIFIC NORTHWEST NATIONAL LABORATORY (United States)

b PACIFIC NORTHWEST NATIONAL LABORATORY (United States)

c University of Tennessee (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY FILM; CRYSTALLINE ORDER; CRYSTALLINE QUALITY; EPITAXIAL THIN FILMS; FILM COMPOSITION; FILM STRUCTURE; HIGH-CRYSTALLINE QUALITY; LATTICE MATCH; LOW DEPOSITION TEMPERATURE; MO CONTENT; MODEL SYSTEM; NANOSCALE DEFECTS; RADIATION RESISTANCE; ROCKING CURVES; RUTHERFORD BACKSCATTERING SPECTROMETRY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STRUCTURAL CHARACTERIZATION; XRD;

CERIUM ALLOYS; CRYSTALLINE MATERIALS; EPITAXIAL FILMS; EPITAXIAL GROWTH; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; PHASE DIAGRAMS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPINODAL DECOMPOSITION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

MOLYBDENUM;

ALLOY; CHROMIUM; MOLYBDENUM;

ARTICLE; CHEMISTRY; MATERIALS TESTING; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; X RAY DIFFRACTION;

ALLOYS; CHROMIUM; MATERIALS TESTING; MICROSCOPY, ELECTRON, SCANNING; MOLYBDENUM; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 84857412364 PISSN: 09538984 EISSN: 1361648X Source Type: Journal
DOI: 10.1088/0953-8984/24/9/095001 Document Type: Article

Times cited : (8)

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