Interfacial energy calculation of bcc/fcc interface

Surface Science

Volumn 507-510, Issue , 2002, Pages 401-405

  Gotoh, Y ^a   Entani, S ^a   Kawanowa, H ^a  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

Epitaxy; Interface states; Metal metal interfaces; Metallic films; Reflection high energy electron diffraction (RHEED); Surface structure, morphology, roughness, and topography

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTALLOGRAPHY; EPITAXIAL GROWTH; INTERFACES (MATERIALS); METALLIC FILMS; MONOLAYERS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SUBSTRATES; SURFACE ROUGHNESS; SURFACE STRUCTURE;

ATOMIC ARRANGEMENT;

INTERFACIAL ENERGY;

EID: 0036609274     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)01277-3     Document Type: Article

References (13)