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Volumn 15, Issue 5, 2001, Pages 599-612
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Aging of fluorocarbon thin films deposited on polystyrene from hyperthermal C3F5+ and CF3+ ion beams
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Author keywords
Aging; Atomic force microscopy; Fluorocarbon; Ion; Modification; Polymer; Surface; X ray photoelectron spectroscopy
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Indexed keywords
AGING OF MATERIALS;
ANGLE MEASUREMENT;
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
FILM GROWTH;
ION BEAMS;
MOLECULAR DYNAMICS;
MOLECULAR WEIGHT;
MONTE CARLO METHODS;
POLYSTYRENES;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
CARBON FILMS;
FLUOROCARBONS;
POLYMER FILMS;
POLYMERS;
SURFACES;
FLUORINE CARBO RATIO;
OXYGEN CARBON RATIO;
WATER CONTACT ANGLE MEASUREMENT;
FLUOROCARBONS;
IONS;
ACTIVE SITE;
AGING PROCESS;
ATOMIC FORCE;
CARBON RATIO;
FLUOROCARBON FILMS;
FLUOROCARBON THIN FILMS;
IN-VACUUM;
LOW MOLECULAR WEIGHT OXIDIZED MATERIAL;
MODIFICATION;
OXYGEN CONTENT;
SURFACE BONDS;
SURFACE RESTRUCTURING;
WATER CONTACT ANGLE MEASUREMENT;
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EID: 84857188281
PISSN: 01694243
EISSN: None
Source Type: Journal
DOI: 10.1163/156856101300189952 Document Type: Article |
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Times cited : (12)
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References (4)
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