A broadband analysis of the optical properties of silver nanoparticle films by in situ real time spectroscopic ellipsometry

Thin Solid Films

Volumn 519, Issue 9, 2011, Pages 2936-2940

  Marsillac, S ^a   Little, S A ^a   Collins, R W ^a  

^a UNIVERSITY OF TOLEDO   (United States)

Author keywords

Interband transition; Intraband transition; Nanoparticles; Optical properties; Particle plasmon polariton; Real time spectroscopic ellipsometry (RTSE); Silver; Spectroscopic ellipsometry

Indexed keywords

BROADBAND ANALYSIS; BROADENING PARAMETERS; DIELECTRIC FUNCTIONS; EX SITU; GROWTH REGIME; IN-SITU; INTER-BAND TRANSITION; INTERBAND; INTRABAND TRANSITION; PARTICLE PLASMON POLARITON; PARTICLE PLASMONS; PARTICULATE FILMS; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; REAL TIME SPECTROSCOPIC ELLIPSOMETRY (RTSE); SILVER NANOPARTICLES; STRUCTURAL CHARACTERISTICS; TIME DURATION;

ATOMIC FORCE MICROSCOPY; COALESCENCE; FILM GROWTH; METALLIC FILMS; NANOPARTICLES; NUCLEATION; OPTICAL PROPERTIES; PHONONS; PHOTONS; PLASMONS; QUANTUM THEORY; SPECTROSCOPIC ANALYSIS; SPECTROSCOPIC ELLIPSOMETRY;

SILVER;

EID: 79952624786     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.11.065     Document Type: Article

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