Linear feature detection based on ridgelet

Science in China, Series E: Technological Sciences

Volumn 46, Issue 2, 2003, Pages

  Hou, Biao ^a   Liu, Fang ^a   Jiao, Licheng ^a  

^a XIDIAN UNIVERSITY   (China)

Author keywords

Linear feature detection; Radon transform; Ridgelet transform; Wavelet transform

Indexed keywords

ANISOTROPY; DISCRETE WAVELET TRANSFORMS; FEATURE EXTRACTION;

LINEAR FEATURE DETECTION; RADON TRANSFORM; RIDGELET TRANSFORM;

LINEAR SYSTEMS;

EID: 34147172844     PISSN: 10069321     EISSN: 1862281X     Source Type: Journal    
DOI: 10.1360/03ye9015     Document Type: Article

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