SCOPUS 정보 검색 플랫폼

Volumn 3, Issue 11, 2011, Pages 4830-4839

Assorted analytical and spectroscopic techniques for the optimization of the defect-related properties in size-controlled ZnO nanowires

(7) Wong, Kin Mun a Fang, Yaoguo a,b Devaux, André a Wen, Liaoyong a Huang, Jian b De Cola, Luisa a Lei, Yong a

a UNIVERSITY OF MÜNSTER (Germany)

b SHANGHAI UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL MODEL; AQUEOUS SOLUTION METHODS; CHEMICAL VAPOUR DEPOSITION; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CRITICAL FUNCTIONS; DONOR CONCENTRATIONS; EXPERIMENTAL ANALYSIS; GREEN EMISSIONS; INTRINSIC DEFECTS; OXYGEN VACANCY DEFECTS; PHOTOLUMINESCENCE INTENSITIES; RADIATIVE LIFETIME; SPECTROSCOPIC TECHNIQUE; TOTAL OXYGEN; ZINC INTERSTITIALS; ZINC VACANCY; ZNO NANOWIRES; ZNO NWS;

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; CURRENT VOLTAGE CHARACTERISTICS; MATHEMATICAL MODELS; NANOWIRES; OXYGEN; SPECTROSCOPIC ANALYSIS; SURFACE DEFECTS; ZINC; ZINC OXIDE;

OXYGEN VACANCIES;

NANOMATERIAL; ZINC OXIDE;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; CRYSTALLIZATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SPECTROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE;

COMPUTER SIMULATION; CRYSTALLIZATION; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MODELS, CHEMICAL; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; SPECTRUM ANALYSIS; SURFACE PROPERTIES; ZINC OXIDE;

EID: 84856428294 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c1nr10806a Document Type: Article

Times cited : (49)

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