A power pulsed low-pressure argon microwave plasma investigated by Thomson scattering: Evidence for molecular assisted recombination

Journal of Physics D: Applied Physics

Volumn 45, Issue 5, 2012, Pages

  Hubner S ^a   Palomares, J M ^a   Carbone, E A D ^a   Van Der Mullen, J J A M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DECAY MECHANISMS; DECAY TIME; DIFFUSION LOSS; GAS PRESSURES; HIGH TEMPERATURE; LOW PRESSURE PLASMA; MICROWAVE PLASMA; PRESSURE REGIME; THOMSON SCATTERING; TIME RESOLUTION;

CARRIER CONCENTRATION; ELECTRON DENSITY MEASUREMENT; LIGHT SCATTERING; PLASMAS;

ARGON;

EID: 84856159238     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/45/5/055203     Document Type: Article

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