A health indicator method for degradation detection of electronic products

Microelectronics Reliability

Volumn 52, Issue 2, 2012, Pages 439-445

  Kumar, Sachin ^a   Vichare, Nikhil M ^a   Dolev, Eli ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DAMAGING EVENTS; DATA COLLECTION RATES; DISTANCE MEASURE; ELECTRONIC PRODUCT; FALSE ALARMS; FAULT INJECTION; HEALTH DEGRADATION; HEALTH INDICATORS; KERNEL ESTIMATORS; MAHALANOBIS DISTANCES; NO FAULT FOUND; PERFORMANCE PARAMETERS; TIME INTERVAL; TIME-PERIODS; WEIGHTED SUM;

COMPUTER SCIENCE; DEGRADATION; FAULT DETECTION; GRAPHIC METHODS; HEALTH; STATISTICAL METHODS;

HEALTH RISKS;

EID: 84855868753     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2011.09.030     Document Type: Article

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