Structural and optical properties of annealed porous silicon bragg reflector for thin-film crystalline silicon solar cells

Energy Procedia

Volumn 10, Issue , 2011, Pages 8-13

  Grau, Maïlys ^a,b   Nguyen, Nhat Tai ^a   Straboni, Alain ^b   Lemiti, Mustapha ^a  

^a UNIVERSITÉ DE LYON   (France)

^b S'TILE   (France)

Author keywords

Porous silicon; Solar cells

Indexed keywords

ANNEALING PARAMETERS; ANNEALING PROCESS; CHARACTERISTIC LENGTH; CRYSTALLINE SILICON SOLAR CELLS; CRYSTALLINE SILICONS; HIGH REFLECTIVITY; MULTILAYER REFLECTIVITY; OPTICAL CONFINEMENT; POROUS SILICON STRUCTURES; SERIES RESISTANCES; SILICON BRAGG REFLECTOR; SILICON CELLS; SILICON SUBSTRATES; STRUCTURAL AND OPTICAL PROPERTIES; THIN-FILM SOLAR CELLS; WAVELENGTH RANGES;

ANNEALING; BRAGG REFLECTORS; CRYSTALLINE MATERIALS; ELECTRIC RESISTANCE; EPITAXIAL GROWTH; MULTILAYERS; NANOSTRUCTURED MATERIALS; OPTICAL MULTILAYERS; OPTICAL PROPERTIES; PHOTOVOLTAIC EFFECTS; POROSITY; REFLECTION; SEMICONDUCTING SILICON COMPOUNDS; SOLAR CELLS;

POROUS SILICON;

EID: 84855691207     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2011.10.144     Document Type: Conference Paper

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