Controlling the crystallite size and influence of the film thickness on the optical and electrical characteristics of nanocrystalline Cu 2S films

Materials Research Bulletin

Volumn 47, Issue 2, 2012, Pages 257-266

  Rafea, M Abdel ^a   Farag, A A M ^b   Roushdy, N ^a  

^a City for Scientific Research and Technology Applications ^*  (Egypt)

^b Ain Shams University   (Egypt)

Author keywords

A. Nanostructures; A. Thin films; C. X ray diffraction; D. Electrical properties; D. Optical properties

Indexed keywords

AFM IMAGE; CONDUCTION MECHANISM; DEPOSITED FILMS; DIELECTRIC CONSTANTS; DIP COATING TECHNIQUES; DIRECT BAND GAP; DISPERSION ENERGIES; DISSIPATION FACTORS; ELECTRICAL CHARACTERISTIC; ELECTRICAL RESISTIVITY; ENERGY DISPERSIVE X RAY SPECTROSCOPY; HETEROJUNCTION DEVICES; HIGHLY DENSE; MEAN FREE PATH; NANO SCALE; NANOCRYSTALLINE CU; NANOCRYSTALLINE FILMS; OPTICAL ABSORPTION MEASUREMENT; PHOTOVOLTAIC CHARACTERISTICS; RECTIFYING PROPERTIES; STRUCTURAL CHARACTERISTICS; TEMPERATURE RANGE; WAVELENGTH RANGES; WELL-DISPERSED;

ACTIVATION ENERGY; ATOMIC FORCE MICROSCOPY; COPPER; CRYSTALLITE SIZE; DISPERSION (WAVES); ELECTRIC CONDUCTIVITY; FILM PREPARATION; HETEROJUNCTIONS; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; SOLAR ABSORBERS; SOLAR ENERGY; STOICHIOMETRY; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

OPTICAL FILMS;

EID: 84855685815     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2011.11.035     Document Type: Article

References (48)

1. F. Zhuge, X. Li, X. Gao, X. Gan, and F. Zhou Mater. Lett. 63 2009 652
2. G.M. Liu, T. Schulmeyer, J. Brotz, A. Klein, and W. Jaegermann Thin Solid Films 431 2003 477
3. R.L.N. Chandrakanthi, and M.A. Careem Thin Solid Films 417 2002 51
4. M. Ashry, and S.A. Fayek Renew. Energy 23 2001 441
5. G.M. Liu, T. Schulmeyer, A. Thissen, A. Klein, and W. Jaegermann Appl. Phys. Lett. 82 2003 2269
6. I.P. Parkin Chem. Soc. Rev. 25 1996 199
7. S. Schneider, J.R. Ireland, M.C. Hersam, and T.J. Marks Chem. Mater. 19 2007 2780
8. L. Isac, A. Duta, A. Kriza, S. Manolache, and M. Nanu Thin Solid Films 515 2007 5755
9. S.V. Bagul, S.D. Chavhan, and R. Sharma J. Phys. Chem. Solids 68 2007 1623
10. S.G. Chen, Y.F. Huang, Y.Q. Liu, Q. Xia, H.W. Liao, and C.G. Long Mater. Lett. 62 2008 2503
11. H.M. Pathan, J.D. Desai, and C.D. Lokhande Appl. Surf. Sci. 202 2002 47
12. S. Lindroos, A. Arnold, and M. Leskela Appl. Surf. Sci. 158 2000 75
13. Z. Xu, and Y. Zhang Mater. Chem. Phys. 112 2008 333
14. M.M. El-Nahass, A.A.M. Farag, and A.A. Atta Synth. Met. 159 2009 589
15. P.P. Banerjee Proc. IEEE 73 2005 1859
16. 2S, Card number 00-023-0961 for orthorhombic phase, Card number 03-065-2980 for cubic phase and Card number 00-026-1116 for hexagonal phase.
17. J. Baltazar-Rodrigues, J.C. De Lima, C.E.M. Campos, and T.A. Grandi Powder Technol. 189 2009 70
18. N.K. Allouche, T.B. Nasr, C. Guasch, and N.K. Turki C. R. Chimie 13 2010 1364
19. K. Wakamura, and I. Tsubota Solid State Ionics 130 3-4 2000 305
20. http://interactagram.com/physics/optics/refraction/
21. C.J. Lu, S.B. Ren, H.M. Shen, J.S. Liu, and Y.N. Wang J. Vac. Sci. Technol. A 15 1997 2167
22. S.B. Majumder, M. Jain, and R.S. Katiyar Thin Solid Films 402 2002 90
23. G. De la Torre, C.G. Claessens, and T. Torres Chem. Commun. 20 2007 2000
24. T. Minami, H. Tanaka, T. Shimakawa, T. Miyata, and H. Sato Jpn. J. Appl. Phys. 43 2004 917
25. H. Tanaka, T. Shimakawa, T. Miyata, H. Sato, and T. Minami Thin Solid Films 469 2004 80
26. S. Ishizuka, K. Suzuki, Y. Okamoto, M. Yanagita, T. Sakurai, K. Akimoto, N. Fujiwara, H. Kobayashi, K. Matsubara, and S. Niki Phys. Status Solidi C 1 2004 1067
27. B. Bialek, I.G. Kim, and J.I. Lee Synth. Met. 129 2002 151
28. S. Agilan, D. Mangalaraj, S.K. Narayandass, S. Velumani, and A. Ignatiev Vacuum 81 2007 813
29. H. Wang, J.Z. Xu, J.J. Zhu, and H.Y. Chen J. Cryst. Growth 244 2002 88
30. J.P. Yang, F.C. Meldrum, and J.H. Fendler J. Phys. Chem. 99 1995 5500
31. U.D. Lanke, and M. Vedawyas Nucl. Inst. Methods Phys. Res. B 155 1999 97
32. S.C. Ray Sol. Energy Mater. Sol. Cells 68 2001 307
33. T. Maruyama Sol. Energy Mater. Sol. Cells 56 1998 85
34. S.H. Wemple, and M. DiDomenico J. Phys. Rev. B 1 1970 193
35. I.Y. Erdogan, and O. Gullu J. Alloys Compd. 492 2010 378
36. K. Santra, C.K. Sarkar, M.K. Mukherjee, and B. Cosh Thin Solid Films 213 1992 226
37. A.A.M. Farag, and I.S. Yahia Opt. Commun. 283 2010 4310
38. F. Kremer J. Non-Cryst. Solids 305 2002 1
39. E. Bobeico, F. Varsano, C. Minarini, and F. Roca Thin Solid Films 444 2003 70
40. A.K. Hassan, R.D. Gould, and A.K. Ray Phys. Status Solidi A 158 1996 K23
41. H. Berger, G. Janiche, and N. Grachovskaya Phys. Status Solidi A 33 1969 417
42. A.K. Abass, A. Krier, and R.A. Colins Phys. Status Solidi A 142 1994 435
43. C.R. Tellier Thin Solid Films 51 1978 311
44. K.L. Chopra Thin Film Phenomena 1969 McGraw Hill New York
45. V.D. Das, and K.S. Bhat J. Phys. D 22 1989 162
46. V.D. Das, and K.S. Bhat Phys. Rev. B 40 1989 1696
47. G.D. Sharma, V.S. Choudhary, S.K. Sharma, and M.S. Roy J. Phys. Chem. Solids 69 2008 2639
48. H.M. Zeyada, M.M. El-Nahass, and E. El-Menyawy Sol. Energy Mater. Sol. Cells 92 2008 1586