Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films

Physica Status Solidi (A) Applied Research

Volumn 158, Issue 2, 1996, Pages

  Hassan, A K ^a,b   Gould, R D ^b   Ray, A K ^a  

^a SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

^b KEELE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; COPPER COMPOUNDS; ELECTRIC RESISTANCE; ORGANOMETALLICS; STRUCTURE (COMPOSITION);

COPPER PHTHALOCYANINES; RESISTIVITY MEASUREMENT; VAN DER PAUW METHOD;

THIN FILMS;

EID: 0030391974     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.2211580234     Document Type: Article

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