Compositional and structural study of Gd implanted ZnO films

AIP Conference Proceedings

Volumn 1151, Issue , 2009, Pages 185-188

  Murmu, Peter P ^a,b,c   Kennedy, John V ^a,c   Markwitz, Andreas ^a,c   Ruck, Ben J ^b,c  

^a GNS SCIENCE   (New Zealand)

^b VICTORIA UNIVERSITY OF WELLINGTON   (New Zealand)

^c MACDIARMID INSTITUTE FOR ADVANCED MATERIALS AND NANOTECHNOLOGY   (New Zealand)

Author keywords

AFM; Ion implantation; Raman spectroscopy; RBS; Si; ZnO

Indexed keywords

EID: 70449848728     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3203234     Document Type: Conference Paper

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