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Volumn 45, Issue 2, 2012, Pages 164-169

Full information from measured ADC test data using maximum likelihood estimation

Author keywords

ADC testing; IEEE 1241; Least squares fit; Maximum likelihood approach

Indexed keywords

ADC TEST; ADC TESTING; EXCITATION SIGNALS; EXPONENTIAL SIGNALS; IEEE STANDARDS; IEEE-1241; LEAST SQUARE; LEAST SQUARES; LEAST SQUARES FIT; MAXIMUM LIKELIHOOD APPROACH; MAXIMUM-LIKELIHOOD EQUATIONS; MEASURED DATA; PRACTICAL IMPLEMENTATION; SINE-WAVE; THREE PARAMETERS; TIME CONSTANTS;

EID: 84655163486     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2011.07.019     Document Type: Article
Times cited : (21)

References (13)
  • 1
    • 0003959605 scopus 로고    scopus 로고
    • IEEE Std. 1241-2000 The Institute of Electrical and Electronics Engineers, Inc., New York
    • IEEE Std. 1241-2000. IEEE Standard for Analog to Digital Converters, The Institute of Electrical and Electronics Engineers, Inc., New York, 2000.
    • (2000) IEEE Standard for Analog to Digital Converters
  • 3
    • 77957857037 scopus 로고    scopus 로고
    • Maximum likelihood estimation of ADC parameters
    • L. Balogh, I. Kollár, A. Sárhegyi Austin, TX, USA, May
    • László Balogh, István Kollár, Attila Sárhegyi. Maximum likelihood estimation of ADC parameters, in: IMTC 2010., Austin, TX, USA, May 2010, pp. 24-29.
    • (2010) IMTC 2010 , pp. 24-29
  • 4
    • 84893384078 scopus 로고    scopus 로고
    • Maximum likelihood estimation of ADC parameters from sine wave test data
    • Iasi, Romania, September
    • László Balogh, Balázs Fodor, Attila Sárhegyi, István Kollár, Maximum likelihood estimation of ADC parameters from sine wave test data, in: 12th IMEKO TC4 Workshop on ADC Modelling and Testing., Iasi, Romania, September 2007, pp. 85-90.
    • (2007) 12th IMEKO TC4 Workshop on ADC Modelling and Testing , pp. 85-90
    • L. Balogh1
  • 8
    • 27644534850 scopus 로고    scopus 로고
    • Improved determination of the best fitting sine wave in ADC testing
    • DOI 10.1109/TIM.2005.855082
    • István Kollár, and J.J. Blair Improved determination of the best fitting sine wave in ADC testing IEEE Transactions on Instrumentation and Measurement 54 5 2005 1978 1983 (Pubitemid 41555257)
    • (2005) IEEE Transactions on Instrumentation and Measurement , vol.54 , Issue.5 , pp. 1978-1983
    • Kollar, I.1    Blair, J.J.2
  • 9
    • 77955229451 scopus 로고    scopus 로고
    • New approximation models for processing exponential stimulus histogram test of ADC
    • Florence, Italy, September
    • Linus Michaeli, Ján Šaliga, Michal Sakmár, Ján Buša, New approximation models for processing exponential stimulus histogram test of ADC, in: Proceedings of IMEKO TC4 International Symposium, Florence, Italy, September, 2008, pp. 1033-1036.
    • (2008) Proceedings of IMEKO TC4 International Symposium , pp. 1033-1036
    • L. Michaeli1
  • 10
    • 0242468039 scopus 로고    scopus 로고
    • ADC testing using interpolated fast fourier transform (IFFT) technique
    • D.K. Mishra ADC testing using interpolated fast fourier transform (IFFT) technique International Journal of Electronics 90 2003 459 469
    • (2003) International Journal of Electronics , vol.90 , pp. 459-469
    • Mishra, D.K.1
  • 12
    • 70049116963 scopus 로고    scopus 로고
    • Exponential fit test - Theoretical analysis and practically implementation
    • Florence, Italy, September
    • J. Vedral, Exponential fit test - theoretical analysis and practically implementation, in: Proceedings of IMEKO TC4 International Symposium, Florence, Italy, September, 2008, pp. 1033-1036.
    • (2008) Proceedings of IMEKO TC4 International Symposium , pp. 1033-1036
    • Vedral, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.