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Volumn 45, Issue 2, 2012, Pages 164-169
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Full information from measured ADC test data using maximum likelihood estimation
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Author keywords
ADC testing; IEEE 1241; Least squares fit; Maximum likelihood approach
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Indexed keywords
ADC TEST;
ADC TESTING;
EXCITATION SIGNALS;
EXPONENTIAL SIGNALS;
IEEE STANDARDS;
IEEE-1241;
LEAST SQUARE;
LEAST SQUARES;
LEAST SQUARES FIT;
MAXIMUM LIKELIHOOD APPROACH;
MAXIMUM-LIKELIHOOD EQUATIONS;
MEASURED DATA;
PRACTICAL IMPLEMENTATION;
SINE-WAVE;
THREE PARAMETERS;
TIME CONSTANTS;
MEASUREMENTS;
MAXIMUM LIKELIHOOD ESTIMATION;
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EID: 84655163486
PISSN: 02632241
EISSN: None
Source Type: Journal
DOI: 10.1016/j.measurement.2011.07.019 Document Type: Article |
Times cited : (21)
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References (13)
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