Improved determination of the best fitting sine wave in ADC testing

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 5, 2005, Pages 1978-1983

  Kollár, István ^a   Blair, Jerome J ^b  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b BECHTEL CORPORATION   (United States)

Author keywords

Analog to digital converter; Analog to digital converter (ADC) test; Effective number of bits (ENOB); Four parameter method; IEEE Standard 1057 1994; IEEE Standard 1241 2000; Least squares (LS); Sine wave fitting; Three parameter method

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CURVE FITTING; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; STATISTICAL METHODS;

SINE WAVE FITTING; SINE WAVE TESTING; THREE PARAMETER METHOD;

ELECTRIC CONVERTERS;

EID: 27644534850     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.855082     Document Type: Article

References (10)

1. IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters, IEEE Standard 1241-2000, 2000.
2. IEEE Standard Digitizing Waveform Recorders, IEEE Standard 1057-1994, 1994.
3. J. Blair, "Sine-fitting software for IEEE standards 1057 and 1241," in Proc. IEEE Instrumentation Measurement Technology Conf., Venice, Italy, May 24-26, 1999, pp. 1504-6.
4. A. van den Bos, "Estimation of Fourier coefficients," IEEE Trans. Instrum. Meas., vol. 38, no. 5, pp. 1005-1007, Oct. 1989.
5. I. Kollár, "Evaluation of sine wave tests of ADC's from windowed data," Comput. Stand. Interfaces, vol. 22, pp. 261-268, 2000.
6. K. Hejn and A. Pacut, "Effective resolution of analog to digital converters - Evolution of accuracy," IEEE Instrum. Meas. Mag., vol. 6, no. 3, pp. 48-55, Sep. 2003.
7. J. Blair and T. Linnenbrink, "Corrected rms error and effective number of bits for sinewave ADC tests," Comput. Stand. Interfaces, vol. 26, no. 1, pp. 43-49, Jan. 2004.
8. T. Z. Bilau, T. Megyeri, A. Sárhegyi, J. Márkus, and I. Kollár, "Four-parameter fitting of sine wave testing result: Iteration and convergence," Comput. Stand. Interfaces, vol. 26, no. 1, pp. 51-56, Jan. 2004.
9. R. A. Wannamaker, S. P. Lipshitz, J. Vanderkooy, and J. N. Wright, "A theory of nonsubtractive dither," IEEE Trans. Signal Process., vol. 48, no. 2, pp. 499-516, Feb. 2000.
10. I. Kollár, "Improved residual analysis in ADC testing," in Proc. 13th Int. Symp. Measurements Research Industry Applications, 9th Workshop ADC Modeling Testing, Athens, Greece, Sep. 29-Oct. 1, 2004, pp. 869-874.