Maximum likelihood estimation of ADC parameters

2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings

Volumn , Issue , 2010, Pages 24-29

  Balogh, László ^a   Kollár, István ^a   Sárhegyi, Attila ^b  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b CYPRESS SEMICONDUCTOR   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADC PARAMETERS; ANALOG-DIGITAL CONVERTER; BEST VALUE; COMPLEX TASK; DYNAMIC TESTING; HIGH PRECISION; INPUT NOISE; LINEARITY ERRORS; MAXIMUM LIKELIHOOD FUNCTION; MEASURED DATA; NON-LINEARITY; SIMULATION AND MEASUREMENT; SINE WAVE FITTING; SINE-WAVE; UNKNOWN PARAMETERS;

DATA PROCESSING; INSTRUMENTS; MEASUREMENT THEORY; OPTIMIZATION; PARAMETER ESTIMATION; TESTING;

MAXIMUM LIKELIHOOD ESTIMATION;

EID: 77957857037     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2010.5488286     Document Type: Conference Paper

References (10)

1. IEEE Standard 1241-2000, Standard for Terminology and Test Methods for Analog-to-Digital Converters., The Institute of Electrical and Electronics Engineers.
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5. B. Widrow, and I. Kollár, Quantization Noise.: Roundoff Error in Digital Computation, Signal Processing, Control, and Communications., Cambridge University Press, Cambridge, 2008.
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8. A. Di Nisio, G. Cavone, N. Giaquinto, L. Fabbiano, M. Savino, Improved Static Testing of A/D Converters for DC Measurements, Instrumentation and Measurement Technology Conference - IMTC 2007, Warsaw, Poland, May 1-3, 2007.
9. Attilio Di Nisio, Laura Fabbiano, Nicola Giaquinto, Mario Savino, Statistical properties of an ML estimator for static ADC testing, 12th Workshop on ADC Modelling and Testing, Iasi, Romania, September 18-22, 2007. Paper F154.
10. Antonio Moschitta, Paolo Carbone, Noise Parameter Estimation From Quantized Data, IEEE Trans. on Instrumentation and Measurement, Vol. 56 No. 3, pp. 736-742, 2007.