Effects of thickness on structures and electrical properties of K 0.5Na 0.5NbO 3 thick films derived from polyvinylpyrrolidone-modified chemical solution

Ceramics International

Volumn 38, Issue SUPPL. 1, 2012, Pages

  Wang, Lingyan ^a,b   Ren, Wei ^a   Yao, Kui ^b   Shi, Peng ^a   Wu, Xiaoqing ^a   Yao, Xi ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

A. Films; C. Electrical properties; Chemical solution deposition; D. Perovskites

Indexed keywords

CHEMICAL SOLUTION DEPOSITION; CHEMICAL SOLUTION DEPOSITION METHOD; CHEMICAL SOLUTIONS; CRITICAL THICKNESS; ELECTRICAL PROPERTY; FERROELECTRIC AND PIEZOELECTRIC PROPERTIES; LEAD-FREE FERROELECTRICS; PEROVSKITE PHASE; PIEZOELECTRIC COEFFICIENT; POLYVINYL PYRROLIDONE; REMNANT POLARIZATIONS;

CHEMICALS; ELECTRIC PROPERTIES; FERROELECTRICITY; NIOBIUM OXIDE; PEROVSKITE; PIEZOELECTRICITY; SODIUM; THICK FILMS; VAPOR DEPOSITION;

FERROELECTRIC FILMS;

EID: 84655162162     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2011.04.104     Document Type: Conference Paper

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