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Volumn 299, Issue 1-2, 1997, Pages 72-77

XRD analysis of ZnO thin films prepared by spray pyrolysis

Author keywords

Aluminium; Pyrolysis; X ray diffraction; Zinc oxide

Indexed keywords

ALUMINUM; PYROLYSIS; SEMICONDUCTOR DOPING; SPRAYING; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

EID: 0031130972     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09281-4     Document Type: Article
Times cited : (137)

References (18)
  • 15
    • 0346927767 scopus 로고    scopus 로고
    • J.L. van Heerden and R. Swanepoel, to be published
    • J.L. van Heerden and R. Swanepoel, to be published.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.