Misfit strain dependence of ferroelectric and piezoelectric properties of clamped (001) epitaxial Pb(Zr 0.52,Ti 0.48)O 3 thin films

Applied Physics Letters

Volumn 99, Issue 25, 2011, Pages

  Nguyen, Minh D ^a,b,c   Dekkers, Matthijn ^a,b   Houwman, Evert ^a   Steenwelle, Ruud ^a   Wan, Xin ^a   Roelofs, Andreas ^d   Schmitz Kempen, Thorsten ^d   Rijnders, Guus ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b SolMateS BV   (Netherlands)

^c HANOI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Viet Nam)

^d AIXACCT SYSTEMS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC AND PIEZOELECTRIC PROPERTIES; MISFIT STRAINS; PIEZOELECTRIC BEHAVIOR; POLARIZATION VECTORS; PZT; PZT FILM; PZT STACK; PZT THIN FILM; R PHASE; RESIDUAL STRAINS; STRAINED THIN FILMS; THEORETICAL MODELS; THIN FILM STACKS;

ELECTROLYTIC CAPACITORS; EPITAXIAL GROWTH; FERROELECTRICITY; LEAD; PIEZOELECTRICITY; PULSED LASER DEPOSITION; TENSILE STRAIN; THERMAL EXPANSION; THIN FILM CIRCUITS; THIN FILMS; VAPOR DEPOSITION; ZIRCONIUM;

FERROELECTRIC FILMS;

EID: 84555218414     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3669527     Document Type: Article

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